MWP NEWS

 

MWP launches 2 new nanotechnology and microscopy journals

 

 

MWP is pleased to announce the launch of two new microscopy-driven journals: Advanced Microscopy and Spectroscopy for Nanotechnology and 3D Electron Microscopy.

 

Advanced Microscopy and Spectroscopy for Nanotechnology will consider publishing of papers dealing with application of advanced microscopy techniques on a large spectrum of materials used in Nanoscience and Nanotechnology. Advanced microscopy techniques include electron microscopy (e.g. SEM, FIB, TEM, STEM) and scanning probe microscopy (e.g. AFM, STM) while advanced spectroscopy techniques cover specific characterization and analysis methods coupled with electron and ion microscopes such as EDS, WDS, EBSD, EELS and many more. The main scope of this journal focuses on the use of cutting-edge tools and related analysis methods on challenging samples in order to find solutions for specific problems faced during characterization processes.

 

3D Electron Microscopy will consider publishing of papers dealing with application of three dimensional electron microscopy techniques on a large spectrum of materials. 3D electron microscopy techniques include in particular the use of SEM, FIB, TEM, STEM for investigation of materials that are in composite form and/or that have 3D networking,  porous structure and features in 3D. The main scope of this journal focuses on the use of cutting-edge tools and related analysis methods on corresponding samples in order to find advanced characterization solutions.