This journal will consider publishing of papers dealing with application of advanced microscopy techniques on a large spectrum of materials used in Nanoscience and Nanotechnology. Advanced microscopy techniques include electron microscopy (e.g. SEM, FIB, TEM, STEM) and scanning probe microscopy (e.g. AFM, STM) while advanced spectroscopy techniques cover specific characterization and analysis methods coupled with electron and ion microscopes such as EDS, WDS, EBSD, EELS and many more. The main scope of this journal focuses on the use of cutting-edge tools and related analysis methods on challenging samples in order to find solutions for specific problems faced during characterization processes.